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AI-enabled high-resolution scanning coherent diffraction imaging

Published:2020-07-27 Issue:4 Volume:117 Page:044103
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Cherukara Mathew J.¹^ORCID,Zhou Tao²,Nashed Youssef³,Enfedaque Pablo⁴,Hexemer Alex⁴,Harder Ross J.¹,Holt Martin V.²

Affiliation:

1. Advanced Photon Source, Argonne National Laboratory, Lemont, Illinois 60439, USA

2. Center for Nanoscale Materials, Argonne National Laboratory, Lemont, Illinois 60439, USA

3. Stats Perform, Chicago, Illinois 60601, USA

4. CAMERA, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA

Funder

U.S. Department of Energy

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/am-pdf/10.1063/5.0013065

Reference21 articles.

1. High-resolution non-destructive three-dimensional imaging of integrated circuits

2. Correlative 3D x-ray fluorescence and ptychographic tomography of frozen-hydrated green algae

3. Revealing the Structure of Stereociliary Actin by X-ray Nanoimaging

4. High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography

5. Strain Imaging of Nanoscale Semiconductor Heterostructures with X-Ray Bragg Projection Ptychography

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