Time-resolved measurement of free carrier absorption, diffusivity, and internal quantum efficiency in silicon
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4819447
Reference35 articles.
1. Ultrafast relaxation of highly excited hot electrons in Si: Roles of theL−Xintervalley scattering
2. Femtosecond pump-probe reflectivity study of silicon carrier dynamics
3. Picosecond photoconductivity in radiation‐damaged silicon‐on‐sapphire films
4. Radiative versus nonradiative decay processes in silicon nanocrystals probed by time-resolved photoluminescence spectroscopy
5. Spatially and time-resolved infrared absorption for optical and electrical characterization of indirect band gap semiconductors
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