A method for the accurate measurement of lattice compressions of low‐Z materials at pressures up to 12 GPa by x‐ray diffraction
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1686514
Reference13 articles.
1. X-Ray Diffraction Studies of the Lattice Parameters of Solids under Very High Pressure
2. X-Ray Diffraction of Substances under High Pressures
3. Continuous observation of polymorphic changes under pressure
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1. Use of energy dispersive method with tungsten carbide opposed anvil high pressure set-up;Bulletin of Materials Science;1987-08
2. Structures and transitions in solid O2 to 13 GPa at 298 K by x‐ray diffraction;The Journal of Chemical Physics;1984-12
3. Some high‐pressure x‐ray diffraction studies using beryllium gasketing on a diffractometer with rotating anode x‐ray source;Review of Scientific Instruments;1984-10
4. Equation of state of sodium;The Journal of Chemical Physics;1984-03-15
5. The compression of solid N2 at 296 K from 5 to 10 GPa;The Journal of Chemical Physics;1984-02
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