Instantaneous crystalline annihilation during normal grain growth in aluminum thin films
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.340398
Reference32 articles.
1. Grain growth in zone-refined lead
2. Grain growth in zone-refined tin
3. The impurity-drag effect on grain growth
4. Grain Growth in Porous Compacts
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2. Breakup and grain growth in thin-film array;Journal of Applied Physics;1997-01
3. Experimental study to validate a model of hillock’s formation in aluminum thin films;Journal of Applied Physics;1996-04
4. The influence of local thermomechanical stress on grain growth in thin Al-1%Si layers on SiO2/Si substrates;Physica Status Solidi (a);1994-11-16
5. Transmission electron microscopy detection of microtexture variations and their effects on thin film stability;Journal of Electronic Materials;1994-10
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