Probing buried organic layers in organic light-emitting diodes under operation by electric-field-induced doubly resonant sum-frequency generation spectroscopy-Reference-Cited by-同舟云学术

Probing buried organic layers in organic light-emitting diodes under operation by electric-field-induced doubly resonant sum-frequency generation spectroscopy

Published:2012-08-13 Issue:7 Volume:101 Page:073304
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Miyamae T.¹²,Takada N.²³,Tsutsui T.²

Affiliation:

1. Nanosystem Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan

2. Chemical Materials Evaluation and Research Base (CEREBA), 1-1-1 Higashi, Tsukuba, Ibaraki 305-0053, Japan

3. Flexible Electronics Research Center, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Reference25 articles.

1. Organic electroluminescent diodes

2. Very high-efficiency green organic light-emitting devices based on electrophosphorescence

3. High Quantum Efficiency in Organic Light-Emitting Devices with Iridium-Complex as a Triplet Emissive Center

4. Optimization of driving lifetime durability in organic LED devices using Ir complex

5. Surface properties probed by second-harmonic and sum-frequency generation

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