Measurement of sound velocity and thickness of thin samples by time-resolved acoustic microscopy
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.368120
Reference2 articles.
1. Scanning acoustic microscopy and its applications to material characterization
2. Thickness measurement of a thin-film layer on an anisotropic substrate by phase-sensitive acoustic microscope
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