Surface ionization source for heavy ions-Reference-Cited by-同舟云学术

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Surface ionization source for heavy ions

Published:1980-04 Issue:4 Volume:51 Page:474-477
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:

Author:

Rasser B.¹,Pearson D. I. C.¹,Remy M.¹

Affiliation:

1. Laboratoire de Physique des Milieux Ionisés, Faculté des Sciences, Case Officielle 140, 54037 Nancy Cedex, France

Publisher

AIP Publishing

Subject

Instrumentation

Reference16 articles.

1. A. Richardt, Thesis (Lyon, 1971);

2. R. Masic, J. M. Sautter, and R. J. Warnecke, Nucl. Instr. and Meth. 71, 339 (1969); NUIMAL0029-554X

3. M. Hashmi and A. J. Van der Houven van Oordt, Proc. 3rd Int. Conf. on Quiescent Plasmas—Elsinore (1971);

4. G. Sidenius, Proc. 1st Int. Conf. Ion Sources—Saclay (1969);

5. H. M. B. Bird and J. P. Flemming, J. Vac. Sc. Techn. 15, 1070 (1978).JVSTAL0022-5355

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3. Account: Surface ionization organic mass spectrometry: mechanism;European Journal of Mass Spectrometry;1996

4. The ionization of thermal and hyperthermal beams of Na, K, and Cs on Si(111) surfaces;The Journal of Chemical Physics;1990-03-15

5. Efficient emitters for surface ionization organic mass spectrometry;International Journal of Mass Spectrometry and Ion Processes;1989-01

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