Secondary ion mass spectrometry and x-ray analysis of superconducting Nb/Pd multilayers-Reference-Cited by-同舟云学术

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Secondary ion mass spectrometry and x-ray analysis of superconducting Nb/Pd multilayers

Published:2000-01-15 Issue:2 Volume:87 Page:717-723
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Gerardi C.,Tagliente M. A.,Del Vecchio A.,Tapfer L.,Coccorese C.,Attanasio C.,Mercaldo L. V.,Maritato L.,Slaughter J. M.,Falco C. M.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.371931

Reference35 articles.

1. Tunneling studies of a metallic superlattice

2. NbZr multilayers. I. Structure and superconductivity

3. Size dependence of the superconducting critical temperature and fields of Nb/Al multilayers

4. Anomalous behavior of the superconducting critical temperature of Mo-V superlattices

5. Electronic and superconducting properties of Mo-Ta superlattices

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. X-ray scattering study of interfacial roughness in Nb/PdNi multilayers;Surface Science;2011-10

2. Angular effects of the critical current inNb∕Pdmultilayers;Physical Review B;2006-08-21

3. Upper critical fields of Nb/Pd multilayers;Journal of Low Temperature Physics;2003

4. Secondary ion mass spectrometry and its application to thin film characterization;Handbook of Thin Films;2002

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