A comparative study of electronic and structural properties of polycrystalline and epitaxial magnetron-sputtered ZnO:Al and Zn1-xMgxO:Al Films—Origin of the grain barrier traps-Reference-Cited by-同舟云学术

A comparative study of electronic and structural properties of polycrystalline and epitaxial magnetron-sputtered ZnO:Al and Zn1-xMgxO:Al Films—Origin of the grain barrier traps

Published:2013-08-14 Issue:6 Volume:114 Page:063709
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Bikowski André,Ellmer Klaus

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4817376

Reference56 articles.

1. Resistivity of polycrystalline zinc oxide films: current status and physical limit

2. New n-Type Transparent Conducting Oxides

3. Transparent Conductive Zinc Oxide

4. Oxide Semiconductor Thin-Film Transistors: A Review of Recent Advances

5. Application of high mobility transparent conductors to enhance long wavelength transparency of the intermediate solar cell in multi-junction solar cells

Cited by 38 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Memory effect in photochromic rare-earth oxyhydride thin films studied by in situ positron annihilation spectroscopy upon photodarkening-bleaching cycling;Physical Review Materials;2024-04-15

2. Influence of Grain Boundaries on Nanoscale Charge Transport Properties of Transparent Conductive ZnO-Based Electrodes;ACS Applied Electronic Materials;2023-12-26

3. The Fermi energy as common parameter to describe charge compensation mechanisms: A path to Fermi level engineering of oxide electroceramics;Journal of Electroceramics;2023-08-09

4. Suppression of grain boundary contributions on carrier mobility in thin Al-doped ZnO epitaxial films;Applied Surface Science;2023-07

5. Effect of Annealing Temperature on the Hardening Mechanism and Nano-mechanical Response of ZnO Single Crystal Wurtzite Phase: A Nanoscale Analysis;Transactions of the Indian Institute of Metals;2023-06-16