Interband tunneling for hole injection in III-nitride ultraviolet emitters

Author:

Zhang Yuewei1ORCID,Krishnamoorthy Sriram1,Johnson Jared M.2,Akyol Fatih1,Allerman Andrew3,Moseley Michael W.3,Armstrong Andrew3,Hwang Jinwoo2,Rajan Siddharth12

Affiliation:

1. Department of Electrical and Computer Engineering, The Ohio State University, Columbus, Ohio 43210, USA

2. Department of Materials Science and Engineering, The Ohio State University, Columbus, Ohio 43210, USA

3. Sandia National Laboratories, Albuquerque, New Mexico 87185, USA

Funder

National Science Foundation

Sandia National Laboratories, National Nuclear Security Administration

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

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4. Review—Reliability and Degradation Mechanisms of Deep UV AlGaN LEDs;ECS Journal of Solid State Science and Technology;2023-05-31

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