The influence of Cu precipitation on electromigration failure in Al‐Cu‐Si
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.351655
Reference28 articles.
1. Electromigration in Thin Al Films
2. RESISTANCE MONITORING AND EFFECTS OF NONADHESION DURING ELECTROMIGRATION IN ALUMINUM FILMS
3. A model for conductor failure considering diffusion concurrently with electromigration resulting in a current exponent of 2
4. Morphology of electromigration-induced damage and failure in Al alloy thin film conductors
5. Reduction of Electromigration in Aluminum Films by Copper Doping
Cited by 50 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Impact of Current induced Joule heating variation on long-term Low melting temperature solder joint stability;2024 IEEE 74th Electronic Components and Technology Conference (ECTC);2024-05-28
2. Control of Microstructure in Iron–Carbon Thin Films by Means of Electromigration;Advanced Engineering Materials;2023-04-02
3. Impact of in situ current stressing on Sn-based solder joint shear stability;Journal of Materials Science: Materials in Electronics;2021-01-06
4. A Critical Review on the Electromigration Effect, the Electroplastic Effect, and Perspectives on the Effects of Electric Current Upon Alloy Phase Stability;JOM;2019-07-26
5. Impact of Electrical Current on the Long-Term Reliability of Fine-Pitch Ball Grid Array Packages with Sn-Ag-Cu Solder Interconnects;Journal of Electronic Materials;2012-10-27
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3