Ultrafast dynamics and short-lived carriers in Cu nitride and oxynitride layers-Reference-Cited by-同舟云学术

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Ultrafast dynamics and short-lived carriers in Cu nitride and oxynitride layers

Published:2020-09-28 Issue:12 Volume:128 Page:125704
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Sergides Marios¹^ORCID,Zervos Matthew²,Othonos Andreas¹^ORCID

Affiliation:

1. Laboratory of Ultrafast Science, Department of Physics, University of Cyprus, P.O. Box 20537, Nicosia 1678, Cyprus

2. Nanostructured Materials and Devices Laboratory, School of Engineering, University of Cyprus, P.O. Box 20537, Nicosia 1678, Cyprus

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/5.0022758

Reference20 articles.

1. Cu3N Thin Film for a New Light Recording Media

2. Copper nitride and tin nitride thin films for write‐once optical recording media

3. Defect Tolerant Semiconductors for Solar Energy Conversion

4. Thin film synthesis and properties of copper nitride, a metastable semiconductor

5. Lithium storage performance of copper nitride films deposited by reactive DC magnetron sputtering

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Oxidation of Cu3N thin films obtained from Cu annealed under NH3:O2 flow: A Raman and N-K-edge NEXAFS study;Journal of Alloys and Compounds;2022-09

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