Electromigration in gold nanowires under AC driving
Author:
Affiliation:
1. Departments of Applied Physics and Electrical Engineering, Yale University, New Haven, Connecticut 06520, USA
Funder
National Science Foundation
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5051638
Reference24 articles.
1. J. R. Black and IEEE, in 2005 IEEE International Reliability Physics Symposium Proceedings—43rd Annual (1967), p. 1.
2. The Changing Physics in Metal Interconnect Reliability
3. Memristive switching of single-component metallic nanowires
4. Resistance switch employing a simple metal nanogap junction
5. Electrical detection of cancer biomarker using aptamers with nanogap break-junctions
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