Cross sections for radicals from electron impact on methane and fluoroalkanes
Author:
Publisher
AIP Publishing
Subject
Physical and Theoretical Chemistry,General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.476580
Reference30 articles.
1. Partial Ionization Cross Sections of He, Ne, H2, and CH4 for Electrons from 20 to 500 eV
2. Absolute partial cross sections for electron-impact ionization of CH4 from threshold to 1000 eV
3. Total and partial electron collisional ionization cross sections for CH4, C2H6, SiH4, and Si2H6
4. Electron impact ionisation of H2O, CO, CO2and CH4
5. Total Cross Sections for Ionization and Attachment in Gases by Electron Impact. I. Positive Ionization
Cited by 83 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Electron collision cross section data in plasma etching modeling;Acta Physica Sinica;2024
2. Highly selective Si3N4 etching on Si using pulsed-microwave CH3F/O2/Ar plasma;Japanese Journal of Applied Physics;2023-07-21
3. Plasma-relevant fast electron impact study of difluoromethane;Plasma Sources Science and Technology;2023-06-01
4. Excitation and fragmentation of the dielectric gas C4F7N: Electrons vs photons;The Journal of Chemical Physics;2023-01-07
5. Plasma-relevant fast electron impact study of trifluoromethane;Plasma Sources Science and Technology;2022-04-01
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3