Examining thermal transport through a frequency-domain representation of time-domain thermoreflectance data
Author:
Affiliation:
1. Department of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA
2. Department of Chemistry, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA
Funder
U.S. Department of Energy (DOE)
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/am-pdf/10.1063/1.4903463
Reference27 articles.
1. Detection of thermal waves through optical reflectance
2. Transient thermoreflectance from thin metal films
3. Single-beam thermowave analysis of semiconductors
4. Micron‐scale thermal characterizations of interfaces parallel or perpendicular to the surface
5. Broadband phonon mean free path contributions to thermal conductivity measured using frequency domain thermoreflectance
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