Critical thickness of equilibrium epitaxial thin films using finite element method
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1745115
Reference12 articles.
1. One-dimensional dislocations. II. Misfitting monolayers and oriented overgrowth
2. Misfit strain and misfit dislocations in lattice mismatched epitaxial layers and other systems
3. Misfit accommodation at interfaces by dislocations
4. A review of theoretical and experimental work on the structure of GexSi1-xstrained layers and superlattices, with extensive bibliography
5. Calculation of critical layer thickness versus lattice mismatch for GexSi1−x/Si strained‐layer heterostructures
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