Higher-harmonics generation in tapping-mode atomic-force microscopy: Insights into the tip–sample interaction-Reference-Cited by-同舟云学术

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Higher-harmonics generation in tapping-mode atomic-force microscopy: Insights into the tip–sample interaction

Published:2000-06-05 Issue:23 Volume:76 Page:3478-3480
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Hillenbrand R.,Stark M.,Guckenberger R.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.126683

Reference16 articles.

1. Atomic Force Microscope

2. Acoustic microscopy by atomic force microscopy

3. Mapping of electrical double-layer force between tip and sample surfaces in water with pulsed-force-mode atomic force microscopy

4. Friction Anisotropy and Asymmetry of a Compliant Monolayer Induced by a Small Molecular Tilt

5. Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopy

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1. Non-Smooth Dynamics of Tapping Mode Atomic Force Microscopy;Journal of Computational and Nonlinear Dynamics;2023-05-04

2. Intermodal coupling spectroscopy of mechanical modes in microcantilevers;Beilstein Journal of Nanotechnology;2023-01-19

3. Scanning gradiometry with a single spin quantum magnetometer;Nature Communications;2022-06-29

4. Characterization of reliability of anti-soiling coatings using tapping mode-AFM phase imaging;Journal of Renewable and Sustainable Energy;2021-03

5. Mode Coupling in Dynamic Atomic Force Microscopy;Physical Review Applied;2021-02-04

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