Fast, Accurate Secondary‐Electron Yield Measurements at Low Primary Energies-Reference-Cited by-同舟云学术

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Fast, Accurate Secondary‐Electron Yield Measurements at Low Primary Energies

Published:1973-04 Issue:4 Volume:44 Page:456-462
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Henrich Victor E.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1686155

Reference8 articles.

1. Method for Detecting Fine Structure in the Secondary Electron Emission Yield and the Application to Si(111)

2. A two electron gun technique for the measurement of secondary emission characteristics of a variety of materials

3. Automatic measurement of secondary electron emission characteristics of TaC, TiC and ZrC

4. Automatic measurement of secondary electron emission characteristics of TaC, TiC and ZrC

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