Raman microprobe determination of local crystal orientation in laser annealed silicon
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.94829
Reference10 articles.
1. Selective epitaxy using silane and germane
2. Selective epitaxy using silane and germane
3. An Etch Pit Technique for Analyzing Crystallographic Orientation in Si Films
4. An Etch Pit Technique for Analyzing Crystallographic Orientation in Si Films
5. An Etch Pit Technique for Analyzing Crystallographic Orientation in Si Films
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