Determination of the critical layer thickness of Si1−xGex/Si heterostructures by direct observation of misfit dislocations
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.99472
Reference17 articles.
1. Ge0.6Si0.4rib waveguide avalanche photodetectors for 1.3 μm operation
2. Waveguide infrared photodetectors on a silicon chip
3. The n-channel SiGe/Si modulation-doped field-effect transistor
4. Enhancement- and depletion-mode p-channel GexSi1-xmodulation-doped FET's
5. Accommodation of Misfit Across the Interface Between Crystals of Semiconducting Elements or Compounds
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