Review of plane grating focusing for soft x‐ray monochromators

Author:

Petersen H.,Jung C.,Hellwig C.,Peatman W. B.,Gudat W.

Publisher

AIP Publishing

Subject

Instrumentation

Reference64 articles.

1. See, e.g., Proc. XAFS V Conference, Seattle 1988, edited by J. M. deLeon, E. A. Stern, D. E. Sayre, Y. Ma, and J. J. Rehr, Physica B 158, (1989); PHYBE30921-4526

2. Proc. XAFS VII Conf., Kobe 1992, edited by H. Kuroda, T. Ohta, T. Morata, Y. Udagawa, and M. Nomura, Appl. Phys. 32, Suppl. 32-2 (1993);

3. See, e.g., Proc. Int. Conf. X-ray and VUV Synchrotron Radiation Instrumentation (SRI), Stanford 1985, edited by G. S. Brown and I. Lindau, Nucl. Instrum. Methods Phys. Res. A 246, (1986); NIMAER0168-9002

4. Proc. 6th Natl. Conf. SRI, Berkeley 1989, edited by R. C. C. Perera and A. C. Thompson, Nucl. Instrum. Methods Phys. Res. A 291, (1990); NIMAER0168-9002

5. Proc SRI III Conf., Tsukuba 1988, Rev. Sci. Instrum. 60, (1989); RSINAK0034-6748

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