Transient analysis of light brightness emitted from high power microwave nitrogen breakdown under external dc magnetic field-Reference-Cited by-同舟云学术

Transient analysis of light brightness emitted from high power microwave nitrogen breakdown under external dc magnetic field

Author:

Wang Lin¹^ORCID,Bao Huaguang¹^ORCID,Ding Dazhi¹^ORCID,Chen Rushan¹^ORCID

Affiliation:

1. Department of Communication Engineering, Nanjing University of Science and Technology, Nanjing 210094, China

Funder

National Key Laboratory on Electromagnetic Environment Effects

National Key Laboratory of Science and Technology on Space microwave

Fundamental Research Funds for the Central Universities

National Natural Science Foundation of China

Jiangsu Province Natural Science Foundation

Publisher

AIP Publishing

Subject

Condensed Matter Physics

Link

Reference37 articles.

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