Vacuum X‐Ray Diffractometer for High Temperature Studies of Metals Sensitive to Contamination by Oxygen and Nitrogen-Reference-Cited by-同舟云学术

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Vacuum X‐Ray Diffractometer for High Temperature Studies of Metals Sensitive to Contamination by Oxygen and Nitrogen

Published:1962-10 Issue:10 Volume:33 Page:1069-1076
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Willens R. H.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1717685

Reference20 articles.

1. Vacuum Properties of Synthetic Dielectrics

2. Bearings for High Vacuum Applications

3. THE MULTIPLE CRYSTAL X‐RAY SPECTROGRAPH

4. Diffracted‐Beam Monochromatization Techniques in X‐Ray Diffractometry

5. Reflected Beam X‐Ray Monochromator for Geiger Counter Diffractometry

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2. Grain-resolved temperature-dependent anisotropy in hexagonal Ti-7Al revealed by synchrotron X-ray diffraction;Materials Characterization;2021-04

3. Reliability of molecular dynamics interatomic potentials for modeling of titanium in additive manufacturing processes;Computational Materials Science;2020-11

4. Adaptive Volume Control in Titanium Alloy for High Temperature Performance;Materials;2019-11-28

5. 4 Enthalpy and Heat Capacity;Handbook of Titanium Based Materials: Thermophysical Properties, Data and Studies;2007

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