High‐temperature/ultrahigh vacuum compatible probe station
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1143275
Reference2 articles.
1. Design of high-vacuum test station for rapid evaluation of vacuum microelectronic devices
2. Sample holder allowing precise orientation, azimuthal rotation, and high temperature flashes in ultrahigh vacuum
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Ultrahigh vacuum sample mount for x-ray photoelectron spectroscopy up to very high temperature (150–1400 K);Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2011-05
2. Ultrahigh vacuum-compatible fabrication and electrical characterization systems for environmentally sensitive metal oxide semiconductor capacitors;Review of Scientific Instruments;2007-06
3. Design of sample holders for surface analysis of powders;Review of Scientific Instruments;1996-11
4. Selective emission of electrons from patterned negative electron affinity cathodes;IEEE Transactions on Electron Devices;1994-04
5. Integration of microstructures onto negative electron affinity cathodes: Fabrication and operation of an addressable negative electron affinity cathode;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;1993-11
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