Thermal imaging of high power diode lasers subject to back-irradiance-Reference-Cited by-同舟云学术

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Thermal imaging of high power diode lasers subject to back-irradiance

Published:2018-03-05 Issue:10 Volume:112 Page:101101
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Li C.¹,Pipe K. P.¹²,Cao C.³,Thiagarajan P.³,Deri R. J.⁴,Leisher P. O.⁴

Affiliation:

1. Department of Mechanical Engineering, University of Michigan, Ann Arbor, Michigan 48109-2125, USA

2. Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, Michigan 48109-2122, USA

3. Lasertel Inc., Tucson, Arizona 85743, USA

4. Lawrence Livermore National Laboratory, Livermore, California 94550, USA

Funder

U.S. Department of Energy

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/am-pdf/10.1063/1.5021658

Reference16 articles.

1. Temperature-power dependence of catastrophic optical damage in AlGaInP laser diodes

2. Investigation of dark line defects induced by catastrophic optical damage in broad-area AlGaInP laser diodes

3. Catastrophic Degradation in GaAs Injection Lasers

4. How does external feedback cause AlGaAs-based diode lasers to degrade?

5. The impact of external optical feedback on the degradation behavior of high-power diode lasers

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1. Research on temperatures located within facet coating layers along z-axis of semiconductor lasers;Optics & Laser Technology;2022-09

2. Spatially resolved self-heating and thermal impedance of laser diodes using CCD-TR imaging;OSA Continuum;2021-04-02

3. Thermoreflectance-Based Measurement of Facet Optical Absorption in High Power Diode Lasers;IEEE Photonics Technology Letters;2019-12-15

4. Thermoreflectance Imaging of Back-Irradiance Heating in High Power Diode Lasers at Several Operating Wavelengths;IEEE Journal of Selected Topics in Quantum Electronics;2019-11

5. Impact of external optical feedback on high-power diode laser lifetime and failure modes;High-Power Diode Laser Technology XVII;2019-03-04

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