Instability and fault analysis of arc plasma using advanced signal processing methods

Author:

Sethi Shakti Prasad12ORCID,Das Debi Prasad12ORCID,Behera Santosh Kumar12ORCID,Ray Nigamananda3

Affiliation:

1. Process Engineering and Instrumentation Department, CSIR-Institute of Minerals and Material Technology 1 , Bhubaneswar 751013, Odisha, India

2. Academy of Scientific and Innovative Research (AcSIR) 2 , Ghaziabad 201002, India

3. Mineral Processing Department, CSIR-Institute of Minerals and Material Technology 3 , Bhubaneswar 751013, Odisha, India

Abstract

This study focuses on the instability and fault analysis of transferred arc plasma, utilizing advanced signal processing methods. Transferred arc plasma systems find significant applications in various industries, including material processing, metallurgy, and waste management. However, the occurrence of instabilities and fault events can severely impact system performance and reliability. To address instabilities in arc plasma, various conditions were experimented. The operating parameters, such as arc voltage, arc current, acoustic, optical, and spectroscopic signals, were simultaneously recorded at a higher sampling rate. The proposed approach employs advanced signal processing methods, such as the Lyapunov exponent, fast-Fourier transform, short-time-Fourier transform, and power spectral density, to analyze the characteristics and instabilities of the transferred arc plasma process. By capturing and analyzing signals from multiple sensors, it becomes possible to identify deviations, irregularities, and fault patterns that arise during plasma operation. The outcomes of this research will have significant implications for the optimization and control of transferred arc plasma processes. By identifying and characterizing instabilities due to fault events at an early stage, system operators can take timely corrective actions, preventing potential damage and improving the overall system efficiency.

Funder

Science and Engineering Research Board

Council of Scientific and Industrial Research, India

Publisher

AIP Publishing

Subject

Instrumentation

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Cell Counting Based on Image Processing for the Detection of Cancer Clumps;2023 International Conference on Computing, Communication, and Intelligent Systems (ICCCIS);2023-11-03

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3