X‐ray reflectivity and transmission electron microscopy studies on thin and ultrathin W/C and W/Si multilayers structures
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.342613
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3. Study of interface correlation in W/C multilayer structure by specular and non-specular grazing incidence X-ray reflectivity measurements;Journal of Applied Physics;2015-10-28
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