Determining the angle-of-arrival of a radio-frequency source with a Rydberg atom-based sensor
Author:
Affiliation:
1. Department of Electrical Engineering, University of Colorado, Boulder, Colorado 80305, USA
2. ANSYS, Inc., Boulder, Colorado 80301, USA
3. National Institute of Standards and Technology, Boulder, Colorado 80305, USA
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
https://aip.scitation.org/doi/pdf/10.1063/5.0045601
Reference30 articles.
1. Microwave dressing of Rydberg dark states
2. Microwave electrometry with Rydberg atoms in a vapour cell using bright atomic resonances
3. Broadband Rydberg Atom-Based Electric-Field Probe for SI-Traceable, Self-Calibrated Measurements
4. Atom-Based RF Electric Field Metrology: From Self-Calibrated Measurements to Subwavelength and Near-Field Imaging
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