Quantitative scanning capacitance microscopy on single subsurface InAs quantum dots
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2885087
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1. Vacuum Pumping Equipment
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5. Local capacitance measurements on InAs dot-covered GaAs surfaces by scanning capacitance microscopy
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