Simple Light Spot Scanner and Its Application on Semiconductor Nuclear Particle Detectors-Reference-Cited by-同舟云学术

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Simple Light Spot Scanner and Its Application on Semiconductor Nuclear Particle Detectors

Published:1967-10 Issue:10 Volume:38 Page:1374-1376
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Schüler Werner

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1720542

Reference4 articles.

1. Observation of surface phenomena on semiconductor devices by a light spot scanning method

2. The Channelling of Ions through Silicon Detectors

3. Anisotropic Energy Loss of Light Particles of MeV Energies in Thin Silicon Single Crystals

4. Fabrication methods for lithium drifted surface barrier silicon detectors

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Scanning optical microscopy;Advances in Imaging and Electron Physics;2020

2. Observation of p-n Junctions with a Flying-Spot Scanner Using a Chopped Photon Beam;Japanese Journal of Applied Physics;1982-04-20

3. Laser scanning technique for the detection of resistivity inhomogeneities in silicon using liquid rectifying contacts;IEEE Transactions on Electron Devices;1980-11

4. Laser Scanning Technique for the Detection of Resistivity and Lifetime Inhomogeneities in Semiconductor Devices;Physica Scripta;1978-12-01

5. The characterization of CdTe and HgI2 crystals and detectors by light spot scanning (LSS);Nuclear Instruments and Methods;1978-03

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