Thickness dependence of the dielectric constant and resistance of Al2O3films
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.323603
Reference8 articles.
1. Deposition and Properties of Aluminum Oxide Obtained by Pyrolytic Decomposition of an Aluminum Alkoxide
2. Radiation resistance of Al2O3MOS devices
3. High‐field transport properties of aluminum‐embedded aluminum oxide films
4. Metallic aluminum particle concentration in aluminum oxide thin films
5. Electrical Properties of Evaporated Aluminum Oxide Films
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