Charge trapping studies in SiO2using high current injection from Si‐rich SiO2films
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.328317
Reference25 articles.
1. Graded or stepped energy band‐gap‐insulator MIS structures (GI‐MIS or SI‐MIS)
2. High current injection into SiO2 from Si rich SiO2 films and experimental applications
3. Electron‐trapping characteristics of W in SiO2
4. Determination of insulator bulk trapped charge densities and centroids from photocurrent‐voltage charactersitcs of MOS structures
5. Interfacial Dopants for Dual-Dielectric, Charge-Storage Cells
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