Probing thickness-dependent dislocation storage in freestanding Cu films using residual electrical resistivity
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2961006
Reference17 articles.
1. Bauschinger and size effects in thin-film plasticity
2. The yield strength of thin copper films on Kapton
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