Kelvin probe force microscopy on corona charged oxidized semiconductor surfaces-Reference-Cited by-同舟云学术

Kelvin probe force microscopy on corona charged oxidized semiconductor surfaces

Published:2004-11-15 Issue:20 Volume:85 Page:4801-4803
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Lägel B.,Ayala M. D.,Schlaf R.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1818343

Reference13 articles.

1. Surface voltage and surface photovoltage: history, theory and applications

2. A novel detection system for defects and chemical contamination in semiconductors based upon the Scanning Kelvin Probe

3. M. Wilson, J. Lagowski, L. Jastrezbski, A. Savtchouk, and V. Faifer, Proceedings of the 2000 International Conference on Characterization and Metrology for ULSI Technology NIST, 2000, Gaithersburg, MD, Vol. 550, pp. 220–225.

4. Surface photovoltage phenomena: theory, experiment, and applications

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Influence of Atmospheric Contaminants on the Work Function of Graphite;Langmuir;2023-08-15

2. A Simplified Method to Estimate Surface Trap Distribution: Potential Decay by Charge Dissipation Along Surface;IEEE Transactions on Dielectrics and Electrical Insulation;2023-06

3. In situ observation of the nanosecond two-dimensional surface charge evolution during the process of a surface discharge streamer;Journal of Applied Physics;2023-05-17

4. Multi-characterization of LiCoO2 cathode films using advanced AFM-based techniques with high resolution;Scientific Reports;2017-09-18

5. Kinetics of Charge Accumulation and Decay on Silicone Rubber/SiO2Nanocomposite Surface;Journal of Electrical Engineering and Technology;2016-09-01