Nondestructive microwave permittivity characterization of ferroelectric thin film using microstrip dual resonator
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1632999
Reference9 articles.
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5. Fabrication and investigation of YBa2Cu3O7−δ/Ba0.05Sr0.95TiO3 thin film structures for voltage tunable devices
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2. New methodology to determine the loss tangent of dielectric planar samples by using electrically coupled resonators;Journal of Electromagnetic Waves and Applications;2020-09-15
3. Low-Voltage Permittivity Control of Coplanar Lines Based on Hafnium Oxide Ferroelectrics Grown on Silicon;IEEE Access;2019
4. Large in-plane permittivity of Ba0.6Sr0.4TiO3 thin films crystallized using excimer laser annealing at 300 °C;Applied Physics Letters;2012-12-10
5. Influence of Mg doping on the dielectric properties of MgO-doped lithium niobate;Physica B: Condensed Matter;2011-04
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