Nonlinear XUV-optical transient grating spectroscopy at the Si L2,3

Nonlinear XUV-optical transient grating spectroscopy at the Si L2,3–edge

Published:2019-05-06 Issue:18 Volume:114 Page:181101
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Bohinc R.¹^ORCID,Pamfilidis G.¹,Rehault J.¹,Radi P.¹^ORCID,Milne C.¹^ORCID,Szlachetko J.²,Bencivenga F.³^ORCID,Capotondi F.³,Cucini R.⁴,Foglia L.³^ORCID,Masciovecchio C.³,Mincigrucci R.³,Pedersoli E.³^ORCID,Simoncig A.³,Mahne N.⁵^ORCID,Cannizzo A.⁶,Frey H. M.⁶,Ollmann Z.⁶,Feurer T.⁶,Maznev A. A.⁷,Nelson K.⁷,Knopp G.¹^ORCID

Affiliation:

1. Paul Scherrer Institut (PSI), 5232 Villigen PSI, Switzerland

2. Institute of Nuclear Physics, Polish Academy of Sciences, 31-342 Kraków, Poland

3. Elettra-Sincrotrone Trieste S.C.p.A., S.S. 14 km 163,5 in Area Science Park, I-34012 Basovizza, Trieste, Italy

4. Istituto Officina dei Materiali-CNR, 34149 Basovizza (TS), Italy

5. IOM-CNR, Strada Statale 14 km 163.5, 34149 Basovizza, Trieste, Italy

6. Institute of Applied Physics, University of Bern, 3012 Bern, Switzerland

7. Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA

Funder

Narodowe Centrum Nauki

Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung

Publisher