A photoemitted electron‐impact ionization method for time‐of‐flight mass spectrometers
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Published:1993-08
Issue:8
Volume:64
Page:2211-2214
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ISSN:0034-6748
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Container-title:Review of Scientific Instruments
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language:en
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Short-container-title:Review of Scientific Instruments
Author:
Cheng P. Y.,Dai H. L.
Cited by
18 articles.
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