Effect of aging on the current transport properties at gold/niobium-doped strontium titanate Schottky junctions-Reference-Cited by-同舟云学术

Effect of aging on the current transport properties at gold/niobium-doped strontium titanate Schottky junctions

Published:2019-03-07 Issue:9 Volume:125 Page:095301
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Hirose Sakyo¹^ORCID,Ueda Shigenori²³^ORCID,Ohashi Naoki⁴⁵^ORCID

Affiliation:

1. Murata Manufacturing Co., Ltd., 1-10-1, Higashikotari, Nagaokakyo-shi, Kyoto 617-8555, Japan

2. Research Center for Advanced Measurement and Characterization, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0077, Japan

3. Synchrotron X-ray Station at SPring-8, National Institute for Materials Science, 1-1-1 Kouto, Sayo, Hyogo 679-5148, Japan

4. National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan

5. Materials Research Center for Element Strategy (MCES), Tokyo Institute of Technology, 4259 Natatsuta, Midori-ku, Yokohama 226-0026, Japan

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5066574

Reference39 articles.

1. Electric-pulse-induced reversible resistance change effect in magnetoresistive films

2. Effects of dust particles and layer properties on organic electronic devices fabricated by stamping

3. Reversible resistive switching of SrTiOx thin films for nonvolatile memory applications

4. Switching characteristics of Cu2O metal-insulator-metal resistive memory

5. Excellent Resistance Switching Characteristics of Pt/Single-crystal Nb-Doped SrTiO3 Schottky Junction

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3. Investigation of Temperature-Dependent Hard X-ray Photoemission Spectra on Au/Nb:SrTiO3 Schottky Junctions;The Journal of Physical Chemistry C;2021-07-05

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5. Erratum: “Effect of aging on the current transport properties at gold/niobium-doped strontium titanate Schottky junctions” [J. Appl. Phys. 125, 095301 (2019)];Journal of Applied Physics;2019-05-07