Affiliation:
1. Institute of Plasma Physics, Chinese Academy of Sciences 1 , Hefei 230031, People’s Republic of China
2. University of California Davis 2 , Davis, California 95616, USA
Abstract
Microwave reflectometry is an invaluable diagnostic tool for measuring electron density profiles in large fusion devices. Density fluctuations near the plasma cutoff layer, particularly those that are time-varying on the timescale of the reflectometry measurement, can result in distortions in phase and/or amplitude of the reflected waveform, which present challenges to the accuracy of the reconstructed profile. The ultra-short pulse reflectometry (USPR) technique eliminates the time-varying issue in that reflectometry data are collected on a nanosecond timescale, essentially freezing the fluctuations in place. An X-mode dedicated 32-channel USPR system has been developed and installed on the EAST, covering the operation frequency range from 52 to 92 GHz. This system enables high-resolution density profile measurements in the plasma pedestal and scrape-off layer, with resolutions reaching 5 mm and 1 μs, respectively. Laboratory testing of the system performance has been conducted, demonstrating the potential of the USPR technique to provide accurate and high-temporal-resolution density profiles in challenging plasma environments.
Funder
National Fusion Energy Program of China
Cited by
1 articles.
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