Analyzing the effects of front-surface fields on back-junction silicon solar cells using the charge-collection probability and the reciprocity theorem-Reference-Cited by-同舟云学术

Analyzing the effects of front-surface fields on back-junction silicon solar cells using the charge-collection probability and the reciprocity theorem

Published:2008-03 Issue:5 Volume:103 Page:054507
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Hermle M.,Granek F.,Schultz O.,Glunz S. W.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.2887991

Reference21 articles.

1. Proceedings of the 19th European Photovoltaic Solar Energy Conference;Mulligan W. P.,2004

2. Proceedings of the 19th European Photovoltaic Solar Energy Conference;Mason N. B.,2004

3. Back-contact solar cells: a review

4. Field effect passivation of high efficiency silicon solar cells

5. Photoinjected hot‐electron damage in silicon point‐contact solar cells

Cited by 64 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Investigation of sub-stoichiometric MoOx hole-selective contacts for rear junction passivating contact silicon solar cells;Journal of Science: Advanced Materials and Devices;2024-03

2. Design, development and analysis of large-area industrial silicon solar cells featuring a full area polysilicon based passivating contact on the rear and selective passivating contacts on the front;Solar Energy Materials and Solar Cells;2023-07

3. A novel approach to reduce both front and rear side power losses in PERC solar cells using different combinations of transparent metal oxides;Ceramics International;2023-01

4. Contactless measurement of current-voltage characteristics for silicon solar cells;Solar Energy Materials and Solar Cells;2022-12

5. Transparent Conductive Oxide Sputtering Damage on Contact Passivation in Silicon Heterojunction Solar Cells with Hydrogenated Nanocrystalline Silicon;Solar RRL;2022-08-25