Measuring femtometer lattice displacements driven by free carrier diffusion in a polycrystalline semiconductor using time-resolved x-ray scattering-Reference-Cited by-同舟云学术

Measuring femtometer lattice displacements driven by free carrier diffusion in a polycrystalline semiconductor using time-resolved x-ray scattering

Author:

Jo Wonhyuk¹²,Landahl Eric C.³,DiChiara Anthony D.⁴,Walko Donald A.⁴,Lee Sooheyong¹⁵

Affiliation:

1. Korea Research Institute of Standards and Science, Daejeon 305-340, South Korea

2. Department of Physics, Soong-Sil University, Seoul 06978, South Korea

3. Department of Physics, DePaul University, Chicago, Illinois 60614, USA

4. Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA

5. Department of Nanoscience, University of Science and Technology (UST), Daejeon 305-340, South Korea

Funder

National Research Foundation of Korea

DePaul University

Argonne National Laboratory

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

Reference24 articles.

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