Effect of electron temperature fluctuations on slowly swept Langmuir probe measurements

Author:

Rudakov D. L.1,Boedo J. A.1,Moyer R. A.1,Stangeby P. C.2,McLean A.2,Watkins J. G.3

Affiliation:

1. Center for Energy Research, University of California, San Diego, La Jolla, California 92093

2. University of Toronto Institute for Aerospace Studies, Toronto, Ontario M3H 5T6, Canada

3. Sandia National Laboratories, Albuquerque, New Mexico 87185

Publisher

AIP Publishing

Subject

Instrumentation

Reference10 articles.

1. F.F. Chen, in Plasma Diagnostic Techniques, edited by R. H. Huddlestone and S. L. Leonard (Academic, New York, 1965).

2. L. Schott, in Plasma diagnostics, edited by W. Lochte-Holtgreven (North–Holland, Amsterdam, 1968).

3. J.D. Swift and M.J. R. Schwar, Electric Probes for Plasma Diagnostics (American Elsevier, New York, 1969).

4. P.C. Stangeby, Plasma Diagnostics: Surface Analysis and Interactions (Academic, New York, 1989).

5. P. C. Stangeby and G. M. McCracken, Nucl. Fusion 30, 1225 (1990).NUFUAU0029-5515

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