Development of a scanning electron microscopy with polarization analysis system for magnetic imaging with ns time resolution and phase-sensitive detection-Reference-Cited by-同舟云学术

Development of a scanning electron microscopy with polarization analysis system for magnetic imaging with ns time resolution and phase-sensitive detection

Published:2018-08 Issue:8 Volume:89 Page:083703
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Schönke Daniel¹,Oelsner Andreas²,Krautscheid Pascal¹³,Reeve Robert M.¹³^ORCID,Kläui Mathias¹³^ORCID

Affiliation:

1. Institut für Physik, Johannes Gutenberg-Universität Mainz, Staudinger Weg 7, 55128 Mainz, Germany

2. Surface Concept GmbH, Am Sägewerk 23a, 55124 Mainz, Germany

3. Graduate School of Excellence Materials Science in Mainz, Staudinger Weg 9, 55128 Mainz, Germany

Funder

SFB/TRR 173 Spin+X

Graduate School of Excellence Materials Science In Mainz

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5037528

Reference37 articles.

1. Current-induced spin–orbit torques

2. Perspective: Interface generation of spin-orbit torques

3. Spatially and time-resolved magnetization dynamics driven by spin–orbit torques

4. Nanoscale imaging of magnetization reversal driven by spin-orbit torque

5. Electric field effect on magnetism in metallic ultra-thin films

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