Machine learning to analyze images of shocked materials for precise and accurate measurements-Reference-Cited by-同舟云学术

Machine learning to analyze images of shocked materials for precise and accurate measurements

Published:2017-09-14 Issue:10 Volume:122 Page:104902
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Dresselhaus-Cooper Leora¹²^ORCID,Howard Marylesa³,Hock Margaret C.³,Meehan B. T.³,Ramos Kyle J.⁴,Bolme Cindy A.⁴^ORCID,Sandberg Richard L.⁴,Nelson Keith A.¹²

Affiliation:

1. Department of Chemistry, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA

2. Institute for Soldier Nanotechnology, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA

3. Nevada National Security Site, North Las Vegas, Nevada 89030, USA

4. Los Alamos National Laboratories, Los Alamos, New Mexico 87545, USA

Funder

U.S. Department of Energy (DOE)

Office of Naval Research (ONR)

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4998959

Reference34 articles.

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