Measurement of shock roughness due to phase plate speckle imprinting relevant for x-ray diffraction experiments on 3rd and 4th generation light sources
Author:
Affiliation:
1. Lawrence Livermore National Laboratory, P. O. Box 808, Livermore, California 94550, USA
2. Laboratory for Laser Energetics, University of Rochester, Rochester, New York 14623-1299, USA
Abstract
Funder
U.S. Department of Energy
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
https://aip.scitation.org/doi/am-pdf/10.1063/5.0117905
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