A generalized model for boron-oxygen related light-induced degradation in crystalline silicon
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http://aip.scitation.org/doi/pdf/10.1063/1.5049325
Reference27 articles.
1. H. Fischer and W. Pschunder, Proceedings of the 10th IEEE PVSC, p. 404, (1973).
2. J. Schmidt et al., Proceedings of the 26th IEEE PVSC, p. 13 (1997).
3. Minority carrier lifetime degradation in boron-doped Czochralski silicon
4. Electronically activated boron-oxygen-related recombination centers in crystalline silicon
5. V. Voronkov and R. Falster, Sol. Stat. Phen. 205, p. 3 (2014).
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