Adsorption of Cu and Ag atoms on Si(111) surfaces: Local density functional determination of geometries and electronic structures
Author:
Publisher
AIP Publishing
Subject
Physical and Theoretical Chemistry,General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.455607
Reference74 articles.
1. Combined AES, LEED, SEM and TEM characterizations of CuSi(100) interfaces
2. Atomic structure of the Cu/Si(111) interface by high-energy core-level Auger electron diffraction
3. Thermally induced structural and compositional modification of the Cu/Si(111)‐7×7 interface
4. Characterization of intermixing at metal-semiconductor interfaces by angle-resolved Auger-electron emission: Cu/Si(111)-7×7
5. Effect of Cu deposition on structural and electronic properties of cleaved Si(111) surfaces
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