Reflection high-energy electron diffraction ϕ scans for in situ monitoring the heteroepitaxial growth of Fe on GaN(0001) by molecular beam epitaxy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3467136
Reference15 articles.
1. Epitaxial growth and characterization of Fe thin films on wurtzite GaN(0001)
2. Thermal stability of epitaxial Fe films on GaN(0001)
3. Measuring the Spin Polarization of a Metal with a Superconducting Point Contact
4. Spin coherence and dephasing in GaN
5. Some New Techniques in Reflection High Energy Electron Diffraction (RHEED) Application to Surface Structure Studies
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