Electron and hole impact ionization coefficients in InP determined by photomultiplication measurements
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.93190
Reference6 articles.
1. Ionization coefficients of electrons and holes in InP
2. Ionization coefficients measured in abrupt InP junctions
3. Impact ionization by electrons and holes in InP
4. The effect of electroabsorption on the determination of ionization coefficients
5. Use of a Schottky barrier to measure impact ionization coefficients in semiconductors
Cited by 154 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Advanced SWIR sensor development at SUI;Infrared Technology and Applications L;2024-06-07
2. Ionization coefficients and excess noise characteristics of AlInAsSb on an InP substrate;Applied Physics Letters;2023-09-25
3. Contactless measurement of minority carrier lifetime and background carrier concentration in unintentionally doped GaAsSb for short-wave infrared detection;AIP Advances;2023-08-01
4. High electric field characteristics of GaAsSb photodiodes on InP substrates;Applied Physics Letters;2023-05-29
5. Zn扩散对InGaAs/InP单光子雪崩光电二极管雪崩击穿概率的影响;ACTA PHOTONICA SINICA;2023
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3