Grain growth stagnation in solid state thin films: A phase-field study
Author:
Affiliation:
1. Department of Materials Science and Engineering, Indian Institute of Technology, Kanpur, Kanpur 208016, Uttar Pradesh, India
Funder
Indian Institute of Technology Kanpur
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
https://aip.scitation.org/doi/pdf/10.1063/5.0049027
Reference41 articles.
1. Electromigration and IC Interconnects
2. Grain Growth in Thin Films
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